Imaging of Laser–Plasma X-Ray Emission with Charge-Injection Devices (CID’s)

LLE Review, Volume 83 119 Introduction X-ray imaging and x-ray spectroscopy are used in laser– plasma-generated physics research to diagnose conditions in the laser targets. Examples of techniques used to image x-ray emission are pinhole cameras, Kirkpatrick–Baez (KB) microscopes, curved crystal optics, and Wölter microscopes.1–3 All spectroscopic diagnostics rely also on spatial resolution to record an x-ray spectrum. Examples of spectroscopic techniques are Bragg crystal diffraction and grating diffraction. The simplest method of recording images is time-integrated exposure of film, a common example being the calibrated Kodak direct exposure film (DEF).4 Alternatively, images can be recorded by a solid-state device that is either directly sensitive to x rays (photons absorbed in the device) or indirectly sensitive (photons absorbed in a phosphor coating, generating visible range photons that are then absorbed in the device).